
Specific features of defect formation in the nSi <P> single crystals at electron irradiation
Author(s) -
S. V. Luniov,
A. I. Zimych,
M. V. Khvyshchun,
Mykola Yevsiuk,
V. T. Maslyuk
Publication year - 2018
Publication title -
eastern-european journal of enterprise technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.268
H-Index - 24
eISSN - 1729-4061
pISSN - 1729-3774
DOI - 10.15587/1729-4061.2018.150959
Subject(s) - irradiation , electron , activation energy , silicon , electron beam processing , deformation (meteorology) , orientation (vector space) , materials science , condensed matter physics , chemistry , crystallography , molecular physics , physics , geometry , optoelectronics , mathematics , composite material , quantum mechanics , nuclear physics