Open AccessThe analysis of the electronic devices substrates roughness testing methods
Author(s) -
Ігор Невлюдов,
Ирина Владимировна Жарикова,
Иван Дмитриевич Перепелица,
Алексей Георгиевич Резниченко
Publication year - 2014
Publication title -
eastern-european journal of enterprise technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.268
H-Index - 24
eISSN - 1729-4061
pISSN - 1729-3774
DOI - 10.15587/1729-4061.2014.21864
Subject(s) - reliability (semiconductor) , surface finish , automation , surface roughness , substrate (aquarium) , computer science , process (computing) , reliability engineering , quality (philosophy) , engineering drawing , electronics , task (project management) , control (management) , materials science , process engineering , mechanical engineering , systems engineering , engineering , artificial intelligence , electrical engineering , composite material , power (physics) , oceanography , physics , quantum mechanics , geology , operating system , philosophy , epistemology