Open AccessFracture-Exafs: A New Method for the Study of Interfaces in thin films and Polycrystalline Materials
Author(s) -
Enrique V. Barrera,
Benji Maruyama,
Steve M. Heald
Publication year - 1990
Publication title -
mrs proceedings
Language(s) - English
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-188-275
Subject(s) - extended x ray absorption fine structure , materials science , fracture (geology) , auger electron spectroscopy , grain boundary , crystallite , surface extended x ray absorption fine structure , composite material , crystallography , metallurgy , absorption spectroscopy , optics , chemistry , microstructure , physics , nuclear physics
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