Temperature Dependence of the Thermal Conductivity of Materials for Microelectronic Packaging: Measuring and Modelling Effects of Microstructure and Impurities
Author(s) -
Ralph B. Dinwiddie,
David G. Onn
Publication year - 1989
Publication title -
mrs proceedings
Language(s) - English
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-167-241
Subject(s) - materials science , crystallite , impurity , microelectronics , thermal conductivity , microstructure , atmospheric temperature range , substrate (aquarium) , thermal , range (aeronautics) , composite material , thermodynamics , metallurgy , nanotechnology , chemistry , physics , oceanography , organic chemistry , geology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom