Open AccessSimulated Image Maps for Use in Experimental High-Resolution Electron Microscopy
Author(s) -
Michael A. O’Keefe,
U. Dahmen,
Crispin Hetherington
Publication year - 1989
Publication title -
mrs proceedings
Language(s) - English
Resource type - Journals
eISSN - 1946-4274
pISSN - 0272-9172
DOI - 10.1557/proc-159-453
Subject(s) - high resolution transmission electron microscopy , materials science , resolution (logic) , electron microscope , transmission electron microscopy , conventional transmission electron microscope , electron tomography , orientation (vector space) , scanning transmission electron microscopy , crystal (programming language) , image contrast , image (mathematics) , optics , artificial intelligence , nanotechnology , computer science , physics , mathematics , geometry , programming language
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