Open AccessConvolutional neural networks for grazing incidence x-ray scattering patterns: thin film structure identification
Author(s) -
Shuai Liu,
Charles Melton,
Singanallur Venkatakrishnan,
Ronald Pandolfi,
Guillaume Freychet,
Dinesh Kumar,
Haoran Tang,
Alexander Hexemer,
Daniela Ushizima
Publication year - 2019
Publication title -
mrs communications
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.751
H-Index - 31
eISSN - 2159-6859
pISSN - 2159-6867
DOI - 10.1557/mrc.2019.26
Subject(s) - scattering , materials science , convolutional neural network , thin film , robustness (evolution) , artificial neural network , small angle x ray scattering , nanoparticle , optics , pattern recognition (psychology) , artificial intelligence , optoelectronics , computer science , nanotechnology , physics , biochemistry , chemistry , gene
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