Open Accessat]Hard-switching reliability studies of 1200 V vertical GaN PiN diodes
Author(s) -
Oleksiy Slobodyan,
Thomas G. Smith,
Jack Flicker,
Stephanie Elizabeth Sandoval,
Christopher M. Matthews,
Michael Van Heukelom,
Robert Kaplar,
Stanley Atcitty
Publication year - 2018
Publication title -
mrs communications
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.751
H-Index - 31
eISSN - 2159-6859
pISSN - 2159-6867
DOI - 10.1557/mrc.2018.204
Subject(s) - materials science , optoelectronics , reliability (semiconductor) , diode , leakage (economics) , trapping , stress (linguistics) , voltage , electrical engineering , power (physics) , physics , quantum mechanics , engineering , ecology , linguistics , philosophy , biology , economics , macroeconomics
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