New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy | Zendy

Ritesh Sachan | Zendy; Yanwen Zhang | Zendy; Xin Ou | Zendy; C. Trautmann | Zendy; Matthew F. Chisholm | Zendy; William J. Weber | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy

Author(s) -

Ritesh Sachan,

Yanwen Zhang,

Xin Ou,

C. Trautmann,

Matthew F. Chisholm,

William J. Weber

Publication year - 2016

Publication title -

journal of materials research/pratt's guide to venture capital sources

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.788

H-Index - 148

eISSN - 0884-2914

pISSN - 0884-1616

DOI - 10.1557/jmr.2016.418

Subject(s) - materials science , transmission electron microscopy , ion , morphology (biology) , scanning transmission electron microscopy , track (disk drive) , energy filtered transmission electron microscopy , scanning confocal electron microscopy , conventional transmission electron microscope , scanning electron microscope , optics , nanotechnology , computer science , composite material , physics , biology , quantum mechanics , operating system , genetics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research