Open AccessCharacterization and Electrical Property of Impurity Concentration in Ge-N Codoped SiC Crystals
Author(s) -
Tian Li,
Xiufang Chen,
Xianfeng Yang,
Xuejian Xie,
Fusheng Zhang,
Xiao Liu,
Rongkun Wang,
Xian-Gang Xu,
Xiaobo Hu,
Ruiqi Wang,
Peng Yu
Publication year - 2018
Publication title -
wuji cailiao xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.252
H-Index - 25
ISSN - 1000-324X
DOI - 10.15541/jim20170256
Subject(s) - materials science , characterization (materials science) , impurity , analytical chemistry (journal) , chemical engineering , nanotechnology , organic chemistry , chemistry , engineering