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Characterization and Electrical Property of Impurity Concentration in Ge-N Codoped SiC Crystals
Author(s) -
Li Tian,
Xiufang Chen,
Yang Xianglong,
XIE Xue-Jian,
Zhang Fu-sheng,
Longfei Xiao,
WANG Rong-Kun,
XU Xian-gang,
Hu Xiaobo,
Ruiqi Wang,
Yu Peng
Publication year - 2018
Publication title -
journal of inorganic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.252
H-Index - 25
ISSN - 1000-324X
DOI - 10.15541/jim20170256
Subject(s) - materials science , characterization (materials science) , impurity , analytical chemistry (journal) , chemical engineering , nanotechnology , organic chemistry , chemistry , engineering

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