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SOC Stack Impedance Characterization and Identification Based on DRT and ADIS Methods
Author(s) -
Xue Wang,
Wenqiang Zhang,
Bo Yu,
Jing Chen
Publication year - 2016
Publication title -
journal of inorganic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.252
H-Index - 25
ISSN - 1000-324X
DOI - 10.15541/jim20150652
Subject(s) - materials science , stack (abstract data type) , characterization (materials science) , identification (biology) , electrical impedance , nanotechnology , computer science , electrical engineering , engineering , botany , biology , programming language

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