Open AccessINFLUENCE OF REFLECTION OF PHOTOELECTRONS FROM THE SURFACE PHOTO-EMF IN THIN SEMICONDUCTOR FILMS AND COMPARE IT WITH THE BULK PHOTO-EMF
Author(s) -
Г. Гулямов,
М. Г. Дадамирзаев,
Н. Ю. Шарибаев
Publication year - 2016
Publication title -
alʹternativnaâ ènergetika i èkologiâ
Language(s) - English
Resource type - Journals
ISSN - 1608-8298
DOI - 10.15518/isjaee.2015.21.002
Subject(s) - electromotive force , photoelectric effect , semiconductor , thin film , reflection (computer programming) , absorption (acoustics) , materials science , optics , optoelectronics , photoresistor , chemistry , physics , nanotechnology , quantum mechanics , computer science , programming language