Open AccessInvestigations of the Deep-Level Parameters in Semiconductors
Author(s) -
I. G. Tursunov
Publication year - 2017
Publication title -
ukrainian journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.213
H-Index - 17
eISSN - 2071-0194
pISSN - 2071-0186
DOI - 10.15407/ujpe62.12.1041
Subject(s) - materials science , semiconductor , ionization , ionization energy , strain (injury) , analytical chemistry (journal) , optoelectronics , chemistry , ion , medicine , organic chemistry , chromatography