Open AccessThickness-Dependent Structural, Electrical, and Optical Properties of ZnS Thin Films Deposited by Thermal Evaporation
Author(s) -
Rahul Vishwakarma
Publication year - 2017
Publication title -
ukrainian journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.213
H-Index - 17
eISSN - 2071-0194
pISSN - 2071-0186
DOI - 10.15407/ujpe62.05.0422
Subject(s) - materials science , scanning electron microscope , crystallite , thin film , band gap , electrical resistivity and conductivity , zinc sulfide , analytical chemistry (journal) , substrate (aquarium) , evaporation , semiconductor , diffraction , optics , optoelectronics , nanotechnology , composite material , zinc , chemistry , metallurgy , physics , engineering , thermodynamics , oceanography , chromatography , geology , electrical engineering