
Effect of Tin on Structural Transformations in the Thin-Film Silicon Suboxide Matrix
Author(s) -
Vasyl Voitovych,
R.M. Rudenko,
V.O. Yuchymchuk,
Mykhailo V. Voitovych,
M. Kras’ko,
Andrii Kolosiuk,
V. Yu. Povarchuk,
I.M. Khachevich,
M.P. Rudenko
Publication year - 2016
Publication title -
ukrainian journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.213
H-Index - 17
eISSN - 2071-0194
pISSN - 2071-0186
DOI - 10.15407/ujpe61.11.0980
Subject(s) - crystallization , tin , materials science , amorphous solid , silicon , suboxide , phase (matter) , amorphous silicon , chemical engineering , crystallography , metallurgy , crystalline silicon , chemistry , organic chemistry , engineering