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Peculiarities of Current Flow in Strongly Compensated Low-Resistance CdTe:Cl Crystals under Ultrasonic Loading
Author(s) -
Ya. М. Olikh,
M. D. Tymochko
Publication year - 2016
Publication title -
ukrainian journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.213
H-Index - 17
eISSN - 2071-0194
pISSN - 2071-0186
DOI - 10.15407/ujpe61.05.0381
Subject(s) - materials science , relaxation (psychology) , impurity , dislocation , condensed matter physics , amplitude , radius , conductivity , crystallographic defect , semiconductor , ultrasonic sensor , chemistry , physics , optics , optoelectronics , acoustics , psychology , social psychology , computer security , organic chemistry , computer science

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