Open AccessDetermination of the parameters of coherent magneto-optical layers on a finite absorbing substrate from thermal radiation spectra
Author(s) -
V. Morozhenko,
В. П. Маслов,
Irina Bariakhtar,
Nataliya Kachur
Publication year - 2020
Publication title -
semiconductor physics, quantum electronics and optoelectronics/semiconductor physics quantum electronics and optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.185
H-Index - 2
eISSN - 1605-6582
pISSN - 1560-8034
DOI - 10.15407/spqeo23.04.400
Subject(s) - spectral line , faraday effect , magnetic field , materials science , substrate (aquarium) , optics , semiconductor , magneto , oscillation (cell signaling) , computational physics , molecular physics , chemistry , physics , optoelectronics , magnet , biochemistry , oceanography , quantum mechanics , astronomy , geology
A possibility of determining the parameters of a coherent magneto-optical layer on a finite incoherent absorbing substrate by analyzing the spectra of its thermal radiation (TR) has been investigated. On the example of a plane-parallel InAs semiconductor plate silver-coated on the back surface, it has been shown that a complex analysis of TR spectra, both without and with the presence of magnetic field, makes it possible to determine the thickness, optical, magneto-optical and electric parameters of the layer. Algorithms for the calculation and analysis of TR spectra are adduced, which simplify determination of layer parameters and increase the accuracy of results. Comparing the position of the extremes of the experimental zero-field spectrum with the theoretical calculations, the thickness of the sample and the plasma oscillation frequency in the used semiconductor have been determined. The analysis of the relative contrast of interference oscillations in the TR spectrum in the magnetic field using previously defined parameters enabled to ascertain the spectral dependence of the Faraday rotation angle and to determine the concentration, effective mass and type of current carriers. It has been assumed, that such analysis of luminescence spectra also allows determining the parameters of magneto-optical layers and structures.