
Ellipsometry of hybrid noble metal-dielectric nanostructures
Author(s) -
A. L. Yampolskiy
Publication year - 2018
Publication title -
semiconductor physics, quantum electronics and optoelectronics/semiconductor physics quantum electronics and optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.185
H-Index - 2
eISSN - 1605-6582
pISSN - 1560-8034
DOI - 10.15407/spqeo21.04.412
Subject(s) - noble metal , ellipsometry , materials science , dielectric , nanostructure , nanotechnology , optoelectronics , metal , thin film , metallurgy