
Reliability challenges of nanoscale avalanche photodiodes
Author(s) -
Jack JiaSheng Huang,
Yu-Heng Jan Hs Chang
Publication year - 2017
Publication title -
moj solar and photoenergy systems
Language(s) - Uncategorized
Resource type - Journals
ISSN - 2577-8374
DOI - 10.15406/mojsp.2017.01.00015
Subject(s) - avalanche photodiode , nanoscopic scale , reliability (semiconductor) , materials science , optoelectronics , optics , nanotechnology , physics , detector , power (physics) , quantum mechanics