Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector | Zendy

Matheus Rebello do Nascimento | Zendy; José Guilherme Pereira Peixoto | Zendy; Leonardo de Castro Pacífico | Zendy; Eric Matos Macêdo | Zendy

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Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector

Author(s) -

Matheus Rebello do Nascimento,

José Guilherme Pereira Peixoto,

Leonardo de Castro Pacífico,

Eric Matos Macêdo

Publication year - 2021

Publication title -

brazilian journal of radiation sciences

Language(s) - English

Resource type - Journals

ISSN - 2319-0612

DOI - 10.15392/bjrs.v9i2c.1665

Subject(s) - detector , mass spectrometry , diode , instrumentation (computer programming) , spectral line , atomic physics , voltage , materials science , chemistry , physics , analytical chemistry (journal) , optics , optoelectronics , computer science , chromatography , astronomy , operating system , quantum mechanics

The X-ray spectrometry is subject to a diversity of problems that distort the measured beam. To observe them, spectra from N20, N25, N30, N60, N80, and N100 radiation qualities were obtained and evaluated their non-correction impact in the values of mean energy when compared with the requirements on ISO 4037-1 standard. The error percentages calculated were 2%, 2%, 2%, 11%, 9%, and 6%, respectively, related to partial energy deposition, efficiency loss, and charge trapping. These results suggest the need for correction of measured spectra, mainly for voltages higher than 30 kV.

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