Open AccessGlobal well-posedness of solutions for the epitaxy thin film growth model
Author(s) -
Ning Duan,
Fengnan Liu,
Xiaopeng Zhao
Publication year - 2021
Publication title -
nonlinear analysis
Language(s) - English
Resource type - Journals
eISSN - 2335-8963
pISSN - 1392-5113
DOI - 10.15388/namc.2021.26.23936
Subject(s) - geodetic datum , a priori and a posteriori , growth model , construct (python library) , nonlinear system , boundary value problem , mathematics , argument (complex analysis) , initial value problem , epitaxy , mathematical analysis , materials science , layer (electronics) , computer science , physics , geology , chemistry , mathematical economics , nanotechnology , geodesy , epistemology , quantum mechanics , programming language , philosophy , biochemistry
In this paper, we consider the global well-posedness of solutions for the initial-boundary value problems of the epitaxy growth model. We first construct the local smooth solution, then by combining some a priori estimates, continuity argument, the local smooth solutions are extended step by step to all t > 0, provided that the initial datums sufficiently small and the smooth nonlinear functions satisfy certain local growth conditions.