Open AccessReliability of Electroretinogram pattern in comparison with Visual Evoked Potential in Neonatal subjects
Author(s) -
Farhad Adhami Moghadam,
Seyed Mohammad Masoud Shushtarian
Publication year - 2011
Publication title -
indian journal of applied research
Language(s) - English
Resource type - Journals
ISSN - 2249-555X
DOI - 10.15373/2249555x/jan2014/133
Subject(s) - reliability (semiconductor) , audiology , evoked potential , ophthalmology , optometry , computer science , medicine , neuroscience , psychology , physics , power (physics) , quantum mechanics