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Continuous Wavelet Transform of a Scanning Electron Microscope Image for Determining the Average Size of Nanoparticles
Author(s) -
В. Е. Семенов,
K. G. Mikheev,
T. N. Mogileva,
Г. М. Михеев
Publication year - 2021
Publication title -
himičeskaâ fizika i mezoskopiâ
Language(s) - English
Resource type - Journals
eISSN - 1727-0529
pISSN - 1727-0227
DOI - 10.15350/17270529.2021.2.19
Subject(s) - scanning electron microscope , materials science , image (mathematics) , electron microscope , microscope , nanoparticle , optics , continuous wavelet transform , wavelet transform , wavelet , nanotechnology , artificial intelligence , computer science , discrete wavelet transform , physics

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