Open AccessEffect of Ru Interlayer thickness on Electrophysical Properties of Co/Ru/Co three-layer film systems
Author(s) -
A. M. Lohvynov,
I. V. Cheshko,
I. M. Pazukha,
K. V. Tyschenko,
O.V. Pylypenkо,
A. Yu. Zahorulko
Publication year - 2022
Publication title -
fìzika ì hìmìâ tverdogo tìla
Language(s) - English
Resource type - Journals
eISSN - 2309-8589
pISSN - 1729-4428
DOI - 10.15330/pcss.23.3.531-535
Subject(s) - electrical resistivity and conductivity , materials science , layer (electronics) , analytical chemistry (journal) , temperature coefficient , phase (matter) , thin film , composite material , chemistry , nanotechnology , electrical engineering , organic chemistry , chromatography , engineering