
Influence of surface morphology on electrophysical properties of PbTe: Sb films
Author(s) -
Ya. P. Saliy,
Lyubomyr Nykyruy
Publication year - 2021
Publication title -
fìzika ì hìmìâ tverdogo tìla
Language(s) - English
Resource type - Journals
eISSN - 2309-8589
pISSN - 1729-4428
DOI - 10.15330/pcss.22.3.415-419
Subject(s) - materials science , crystallite , substrate (aquarium) , mica , thin film , semiconductor , ceramic , seebeck coefficient , hall effect , doping , composite material , condensed matter physics , optoelectronics , metallurgy , electrical resistivity and conductivity , nanotechnology , thermal conductivity , oceanography , physics , engineering , electrical engineering , geology
The electrophysical properties of polycrystalline doped semiconductor thin films PbTe: Sb deposited on mica and sital (glass based ceramic) substrates are considered. The thickness dependencies of carrier mobility, of Hall coefficient and of Seebeck coefficient, and the correlations between these parameters for films deposited on different substrate materials were studied. The peculiarities of growth of thin films and their structural parameters are analyzed taking into account the features of the ‘substrate – film’ boundary section.