Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors | Zendy

Oksana Boyko | Zendy; Ze Hotra | Zendy

Open Access

Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors

Author(s) -

Oksana Boyko,

Ze Hotra

Publication year - 2020

Publication title -

physics and chemistry of solid state

Language(s) - English

Resource type - Journals

eISSN - 2309-8589

pISSN - 1729-4428

DOI - 10.15330/pcss.21.4.737-742

Subject(s) - linearization , transfer function , control theory (sociology) , quadratic function , nonlinear system , quadratic equation , amplifier , temperature measurement , range (aeronautics) , function (biology) , atmospheric temperature range , observational error , semiconductor , scaling , materials science , physics , mathematics , computer science , optoelectronics , thermodynamics , engineering , electrical engineering , statistics , cmos , artificial intelligence , composite material , biology , geometry , control (management) , quantum mechanics , evolutionary biology

The analysis of the nonlinearity of the transfer function of primary temperature transducers based on transistor structures has been performed. It’s shown that the quadratic component of the transfer function creates a significant nonlinearity error up to 0,2-0,6°C. We have developed methods of linearization based on both the formation of compensatory measuring current and change of the conversion factor of the output scaling amplifier at certain ranges of temperature measurement, which ensure their use in precision temperature measuring devices. The measurement error does not exceed 0.01°C in the range of 30-100°C.

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