
Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors
Author(s) -
Oksana Boyko,
Ze Hotra
Publication year - 2020
Publication title -
fìzika ì hìmìâ tverdogo tìla
Language(s) - English
Resource type - Journals
eISSN - 2309-8589
pISSN - 1729-4428
DOI - 10.15330/pcss.21.4.737-742
Subject(s) - linearization , transfer function , control theory (sociology) , quadratic function , nonlinear system , quadratic equation , amplifier , temperature measurement , range (aeronautics) , function (biology) , atmospheric temperature range , observational error , semiconductor , scaling , materials science , physics , mathematics , computer science , optoelectronics , thermodynamics , engineering , electrical engineering , statistics , cmos , artificial intelligence , composite material , biology , geometry , control (management) , quantum mechanics , evolutionary biology
The analysis of the nonlinearity of the transfer function of primary temperature transducers based on transistor structures has been performed. It’s shown that the quadratic component of the transfer function creates a significant nonlinearity error up to 0,2-0,6°C. We have developed methods of linearization based on both the formation of compensatory measuring current and change of the conversion factor of the output scaling amplifier at certain ranges of temperature measurement, which ensure their use in precision temperature measuring devices. The measurement error does not exceed 0.01°C in the range of 30-100°C.