Open AccessAutomation of measurements of photoelectric parameters of high-impedance semiconductor films
Author(s) -
Bogdan Dzundza,
V.V. Prokopiv,
T.M. Мazur,
L. D. Yurchyshyn
Publication year - 2018
Publication title -
fìzika ì hìmìâ tverdogo tìla
Language(s) - English
Resource type - Journals
eISSN - 2309-8589
pISSN - 1729-4428
DOI - 10.15330/pcss.19.4.363-367
Subject(s) - semiconductor , automation , photoelectric effect , photoconductivity , electrical impedance , materials science , optoelectronics , electrical engineering , electrical resistivity and conductivity , engineering , mechanical engineering
A method of measuring electrical conductivity and photoconductivity of semiconductor films with high electrical resistance has been described. The electric circuit has been presented and the computer program has been developed. That provides automation of measurements, registration and primary processing of data with possibility of plotting time dependences for preliminary analysis of experimental data during measurement.