Open AccessOptical properties of CdS/CdTe heterojunction prepared by physical vapor deposition technique
Author(s) -
Lyubomyr Nykyruy,
Olha Yaremiichuk,
Zhanna Zapukhlyak,
R. Yavorskyi,
П. Потера,
Ivanna Malyarska,
Olga Fedoryk
Publication year - 2019
Publication title -
fìzika ì hìmìâ tverdogo tìla
Language(s) - English
Resource type - Journals
eISSN - 2309-8589
pISSN - 1729-4428
DOI - 10.15330/pcss.19.3.209-216
Subject(s) - thin film , cadmium telluride photovoltaics , materials science , deposition (geology) , attenuation coefficient , heterojunction , layer (electronics) , refractive index , evaporation , absorption (acoustics) , optoelectronics , analytical chemistry (journal) , optics , nanotechnology , composite material , chemistry , paleontology , physics , chromatography , sediment , biology , thermodynamics
The paper presents the study of the optical properties of a thin layer of Cadmium Sulphide deposited on Cadmium Telluride films. CdTe thin films were obtained by vapor phase condensation method using different technological factors, in particular, different thickness (different time of deposition τ) on glass substrates. After deposition the optical properties were analysed by Swanepoel method, using transmission spectra. The upper thin layer of CdS was deposited by thermal evaporation method on CdTe thin films. The change in optical properties of CdS/CdTe heterojunction in comparison with CdTe thin films was investigated. Using a Swanepoel method were calculated the main optical constants, such as refractive index, absorption coefficient and optical conductivity. By this method the thickness of the thin film was determined and compared with the experimental values obtained by the profilometer.