
High-Temperature X–ray Diffraction Studies of Al–Ni–Hf Ternary Alloys
Author(s) -
Olena Shved,
S. Mudry,
Yuriy Kulyk
Publication year - 2017
Publication title -
fìzika ì hìmìâ tverdogo tìla
Language(s) - English
Resource type - Journals
eISSN - 2309-8589
pISSN - 1729-4428
DOI - 10.15330/pcss.18.3.324-327
Subject(s) - intermetallic , thermal expansion , tetragonal crystal system , ternary operation , materials science , diffraction , thermodynamics , phase (matter) , x ray crystallography , thermal , metallurgy , chemistry , alloy , physics , optics , organic chemistry , computer science , programming language
Phase content and temperature dependences of cell parameters for intermetallics HfNi2Al5, Hf6Ni8Al15 and Ni2Al3, existed in Al-Ni-Hf ternary system have been studied by means of X-ray diffraction method. Experimental values of cell parameters at different temperature were used to calculate the thermal expansion coefficients and their temperature dependences. It is shown that for intermetallic phase with cubic structure temperature dependence of thermal expansion coefficient is significantly different than for l one with tetragonal structure.