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Analysis of surface polyimide composite films with SiO filled by atomic force microscope
Author(s) -
А В Мурадов,
А. И. Купчишин
Publication year - 2013
Publication title -
chemical bulletin of kazakh national university
Language(s) - English
Resource type - Journals
eISSN - 2312-7554
pISSN - 1563-0331
DOI - 10.15328/chemb_2013_390-94
Subject(s) - polyimide , composite number , materials science , composite material , polymer , atomic force microscopy , morphology (biology) , filler (materials) , scanning electron microscope , nanotechnology , layer (electronics) , biology , genetics

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