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Glove Defect Detection Via YOLO V5
Author(s) -
Yong Chen How,
Ahmad Fakhri Ab. Nasir,
Khairul Fikri Muhammad,
Anwar P. P. Abdul Majeed,
Mohd Azraai Mohd Razman,
Muhammad Aizzat Zakaria
Publication year - 2022
Publication title -
mekatronika
Language(s) - Uncategorized
Resource type - Journals
ISSN - 2637-0883
DOI - 10.15282/mekatronika.v3i2.7342
Subject(s) - overfitting , inference , computer science , robustness (evolution) , artificial intelligence , machine learning , biochemistry , chemistry , artificial neural network , gene

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