Open AccessStudying the structural, optical spectroscopic ellipsometry and electrical properties of variable-CdS thickness/CdTe for solar cell applications
Author(s) -
M. A. Sebak,
S. Ghalab,
Atef El-Taher,
E.R. Shaaban
Publication year - 2022
Publication title -
chalcogenide letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.234
H-Index - 30
eISSN - 1841-4834
pISSN - 1584-8663
DOI - 10.15251/cl.2022.196.389
Subject(s) - materials science , wurtzite crystal structure , band gap , cadmium telluride photovoltaics , refractive index , thin film , ellipsometry , solar cell , layer (electronics) , optoelectronics , heterojunction , analytical chemistry (journal) , optics , nanotechnology , chemistry , zinc , physics , chromatography , metallurgy