Open AccessEvaluation of Majority Charge Carrier and Impurity Concentration Using Hot Probe Method for Mono Crystalline Silicon (100) Wafer
Author(s) -
Nahid Akter
Publication year - 2015
Publication title -
deleted journal
Language(s) - English
Resource type - Journals
ISSN - 2201-2311
DOI - 10.14810/ijamse.2015.4402
Subject(s) - wafer , impurity , silicon , materials science , optoelectronics , charge (physics) , crystalline silicon , analytical chemistry (journal) , chemistry , chromatography , physics , organic chemistry , quantum mechanics
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