Open AccessRISK AND RELIABILITY ANALYSIS OF SAS USING COST IMPORTANCE MEASURES
Author(s) -
RamaKoteswara Rao Alla
Publication year - 2016
Publication title -
electrical and electronics engineering an international journal
Language(s) - English
Resource type - Journals
ISSN - 2200-5846
DOI - 10.14810/elelij.2016.5104
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , risk analysis (engineering) , statistics , engineering , medicine , mathematics , power (physics) , physics , quantum mechanics
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