
Defect Classification of Cross-section of Additive Manufacturing Using Image-Labeling
Author(s) -
Lee Jeongseong,
Choi Byung Joo,
Moon Gu Lee,
Jung Sub Kim,
SangWon Lee,
Young Eun Jeon
Publication year - 2020
Publication title -
han'gug gi'gye ga'gong haghoeji/han-guk gigye gagong hakoeji
Language(s) - English
Resource type - Journals
eISSN - 2288-0771
pISSN - 1598-6721
DOI - 10.14775/ksmpe.2020.19.07.007
Subject(s) - section (typography) , cross section (physics) , image (mathematics) , artificial intelligence , pattern recognition (psychology) , computer science , computer vision , physics , operating system , quantum mechanics