Open AccessDefect Classification of Cross-section of Additive Manufacturing Using Image-Labeling
Author(s) -
Jeong-Seong Lee,
Byungjoo Choi,
Moon Gu Lee,
Jung-Sub Kim,
SangWon Lee,
Yongho Jeon
Publication year - 2020
Publication title -
journal of the korean society of manufacturing process engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-0771
pISSN - 1598-6721
DOI - 10.14775/ksmpe.2020.19.07.007
Subject(s) - section (typography) , cross section (physics) , image (mathematics) , artificial intelligence , pattern recognition (psychology) , computer science , computer vision , physics , operating system , quantum mechanics
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