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Development of Contact-Type Thickness Measurement Machine using LVDT Sensors
Author(s) -
Ki-Yeol Shin,
Seon Keun Hwang
Publication year - 2015
Publication title -
journal of the korean society of manufacturing process engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-0771
pISSN - 1598-6721
DOI - 10.14775/ksmpe.2015.14.4.151
Subject(s) - repeatability , calibration , reproducibility , linear variable differential transformer , measure (data warehouse) , measurement uncertainty , standard deviation , accuracy and precision , electrical engineering , engineering , mathematics , computer science , voltage , transformer , statistics , distribution transformer , database

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