Open AccessDefect Detection in Fabric using Wavelet Transform and Genetic Algorithm
Author(s) -
Depavath Harinath,
K. Babu,
P. Satyanarayana,
M. V. Ramana Murthy
Publication year - 2015
Publication title -
transactions on machine learning and artificial intelligence
Language(s) - English
Resource type - Journals
ISSN - 2054-7390
DOI - 10.14738/tmlai.36.1551
Subject(s) - computer science , genetic algorithm , wavelet transform , artificial intelligence , wavelet , algorithm , pattern recognition (psychology) , computer vision , machine learning