z-logo
open-access-imgOpen Access
Defect Detection in Fabric using Wavelet Transform and Genetic Algorithm
Author(s) -
Depavath Harinath,
K. Ramesh Babu,
P. Satyanarayana,
M. V. Ramana Murthy
Publication year - 2015
Publication title -
transactions on machine learning and artificial intelligence
Language(s) - English
Resource type - Journals
ISSN - 2054-7390
DOI - 10.14738/tmlai.36.1551
Subject(s) - computer science , genetic algorithm , wavelet transform , artificial intelligence , wavelet , algorithm , pattern recognition (psychology) , computer vision , machine learning

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom