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Integrated skin sensitization assessment based on OECD methods (I): Deriving a point of departure for risk assessment_suppl4
Author(s) -
Andreas Natsch
Publication year - 2022
Publication title -
altex
Language(s) - English
Resource type - Journals
eISSN - 1868-8551
pISSN - 1868-596X
DOI - 10.14573/altex.2201141s4
Subject(s) - local lymph node assay , skin sensitization , guideline , computer science , robustness (evolution) , sensitization , risk assessment , data mining , confidence interval , applicability domain , statistics , econometrics , medicine , machine learning , mathematics , quantitative structure–activity relationship , pathology , chemistry , immunology , biochemistry , computer security , gene

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