Open AccessIn-Depth Practical Study of Length Metrology With Laser Interferometers Applying Different Techniques
Author(s) -
Ihab H. Naeim
Publication year - 2020
Publication title -
ssrg international journal of applied physics
Language(s) - English
Resource type - Journals
ISSN - 2350-0301
DOI - 10.14445/23500301/ijap-v7i2p106
Subject(s) - metrology , astronomical interferometer , optics , laser , interferometry , computer science , physics