Open AccessDesign of SRAM based BTI Sensor for Improved Cell Stability
Author(s) -
Y. Alekhya,
T Sindhusha,
S. Mahalakshmi,
N. Swathi,
S Sharvani
Publication year - 2020
Publication title -
ssrg international journal of electronics and communication engineering
Language(s) - English
Resource type - Journals
eISSN - 2349-9184
pISSN - 2348-8549
DOI - 10.14445/23488549/ijece-v5i8p102
Subject(s) - stability (learning theory) , static random access memory , reliability engineering , computer science , materials science , electronic engineering , engineering , machine learning