Open AccessAssessment of Reliability of Distribution Network with embedded Generation
Author(s) -
Modu Abba Gana,
Ishaku Abdul Dalyop,
Musa Mustapha
Publication year - 2020
Publication title -
ssrg international journal of electrical and electronics engineering
Language(s) - English
Resource type - Journals
eISSN - 2349-9176
pISSN - 2348-8379
DOI - 10.14445/23488379/ijeee-v7i2p107
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , engineering , physics , power (physics) , quantum mechanics