Open AccessImplementation of SIFT for detection of electronic waste
Author(s) -
R. Vallikannu,
V. Nithya
Publication year - 2018
Publication title -
international journal of engineering and technology
Language(s) - English
Resource type - Journals
ISSN - 2227-524X
DOI - 10.14419/ijet.v7i2.8.10461
Subject(s) - scale invariant feature transform , electronic waste , electronics , computer science , set (abstract data type) , matching (statistics) , process (computing) , artificial intelligence , electronic equipment , scale (ratio) , process engineering , computer vision , waste management , pattern recognition (psychology) , feature extraction , engineering , mathematics , computer hardware , statistics , electrical engineering , physics , operating system , quantum mechanics , programming language
The paper focuses on the investigation of image processing of Electronic waste detection and identification in recycling process of all Electronic items. Some of actually collected images of E-wastes would be combined with other wastes. For object matching with scale in-variance the SIFT (Scale -Invariant- Feature Transform) is applied. This method detects the electronic waste found among other wastes and also estimates the amount of electronic waste detected the give set of wastes. The detection of electronics waste by this method is most efficient ways to detect automatically without any manual means.