Open AccessBased on the Enterprise Exchange Network Path Reliability Design
Author(s) -
Zhu Hongxiang
Publication year - 2014
Publication title -
international journal of u- and e-service, science and technology
Language(s) - English
Resource type - Journals
eISSN - 2207-9718
pISSN - 2005-4246
DOI - 10.14257/ijunesst.2014.7.5.31
Subject(s) - reliability (semiconductor) , path (computing) , computer science , reliability engineering , network planning and design , computer network , engineering , power (physics) , physics , quantum mechanics