Open AccessBayesian Networks Application to Reliability Evaluation of Distribution Systems Containing Micro-Grids or Looped Network
Author(s) -
Liai Gao,
Zhou Yongjie,
Kun Su,
Congcong Hou,
Limin Hou
Publication year - 2016
Publication title -
international journal of grid and distributed computing
Language(s) - English
Resource type - Journals
eISSN - 2207-6379
pISSN - 2005-4262
DOI - 10.14257/ijgdc.2016.9.10.31
Subject(s) - computer science , reliability (semiconductor) , bayesian network , reliability engineering , bayesian probability , data mining , artificial intelligence , engineering , power (physics) , physics , quantum mechanics