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Reliability Evaluation under Shock Model
Author(s) -
Emmanuel Ejembi,
Shawulu Hunira Nggada
Publication year - 2018
Publication title -
international journal of control and automation
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2207-6387
pISSN - 2005-4297
DOI - 10.14257/ijca.2018.11.8.12
Subject(s) - shock (circulatory) , reliability (semiconductor) , reliability engineering , computer science , engineering , physics , medicine , thermodynamics , power (physics)

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