Open AccessAlternative Erase Verify: The Optimization for Longer Data Retention of NAND FLASH Memory
Author(s) -
Juwan Seo,
Namgi Kim,
Min Choi
Publication year - 2017
Publication title -
international journal of control and automation
Language(s) - English
Resource type - Journals
eISSN - 2207-6387
pISSN - 2005-4297
DOI - 10.14257/ijca.2017.10.2.12
Subject(s) - nand gate , data retention , flash (photography) , computer science , computer hardware , embedded system , logic gate , algorithm , computer security , physics , optics
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