Open AccessStudy on IGBT Module Aging and Automatic Test Systems
Author(s) -
Yaping Li,
Luowei Zhou,
Xiong Du,
Pengju Sun,
Junke Wu
Publication year - 2016
Publication title -
international journal of control and automation
Language(s) - English
Resource type - Journals
eISSN - 2207-6387
pISSN - 2005-4297
DOI - 10.14257/ijca.2016.9.12.03
Subject(s) - insulated gate bipolar transistor , test (biology) , reliability engineering , computer science , engineering , electrical engineering , geology , voltage , paleontology