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Use of Sensitivity Method for the Detection and the Localization of Linear System Defect
Author(s) -
Hassene Bedoui,
Nasreddine Bouguila,
Kamel Ben Othman
Publication year - 2014
Publication title -
international journal of control and automation
Language(s) - English
Resource type - Journals
eISSN - 2207-6387
pISSN - 2005-4297
DOI - 10.14257/ijca.2014.7.5.03
Subject(s) - sensitivity (control systems) , computer science , mathematics , engineering , electronic engineering

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