Open AccessReliability Prediction of Touch-Machine Control Panel Using MIL-HDBK-217F and Telcordia SR-332 : Case Study
Author(s) -
Guk Jin Lee,
Sang Boo Kim,
Woo Jae Park,
Keuk Ki Oh,
Jin Whan Park,
Dong Geon Lee
Publication year - 2016
Publication title -
si'seu'tem enji'ni'eoling hagsulji/siseutem enjinieoring haksulji
Language(s) - English
Resource type - Journals
eISSN - 2288-3592
pISSN - 1738-480X
DOI - 10.14248/jkosse.2016.12.2.009
Subject(s) - reliability (semiconductor) , reliability engineering , capacitor , control (management) , quality (philosophy) , computer science , engineering , electrical engineering , artificial intelligence , voltage , power (physics) , philosophy , physics , epistemology , quantum mechanics