Open AccessA Study on the Reliability Analysis Methodology of Passenger Door System of Electrical Type
Author(s) -
Chul Sub Kim,
Hi Sung Lee
Publication year - 2014
Publication title -
si'seu'tem enji'ni'eoling hagsulji/siseutem enjinieoring haksulji
Language(s) - English
Resource type - Journals
eISSN - 2288-3592
pISSN - 1738-480X
DOI - 10.14248/jkosse.2014.10.1.043
Subject(s) - mean time between failures , reliability (semiconductor) , reliability engineering , computer science , engineering , field (mathematics) , failure rate , power (physics) , physics , mathematics , quantum mechanics , pure mathematics