Open AccessFabrication of Vanadium Doped Zinc Oxide Thin Film to Enhance the Optical, Magnetic and Electrical Properties using Electrospray Technique
Author(s) -
M.H. Haja sheriff,
S. Murugan,
Rajesh Kumar,
A. Manivasaham
Publication year - 2021
Publication title -
asian journal of chemistry/asian journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.145
H-Index - 34
eISSN - 0975-427X
pISSN - 0970-7077
DOI - 10.14233/ajchem.2021.23185
Subject(s) - wurtzite crystal structure , photoluminescence , vanadium , sheet resistance , doping , hall effect , chemistry , band gap , zinc , analytical chemistry (journal) , electrical resistivity and conductivity , vanadium oxide , thin film , transmittance , materials science , optoelectronics , nanotechnology , inorganic chemistry , organic chemistry , engineering , layer (electronics) , chromatography , electrical engineering
Vanadium doped zinc oxide was deposited using a homemade electrospray technique. The structural,optical, magnetic, surface morphology and electrical studies were carried out using XRD, UV-vis-NIRspectroscopy, HRSEM, AFM, photoluminescence, VSM and Hall effect, respectively. The XRD resultsrevealed that the addition of vanadium(V) does not affect hexagonal wurtzite structure in the films.Photoluminescence study implies the increase of oxygen vacancy on surface of the samples and thehexagonal plates like grains are found on the film surface and formation of cluster as doping percentageincreases. Hall effect shows the remarkable improvement in carrier concentration, resistivity andmobility. The sheet resistance decreases to 59.5 × 102 Ω/2 for 4 at% of vanadium. All the samplesachieved the transmittance above 80% in the visible region and optical band gap increases. The magneticstudy shows that the enhancement of paramagnetic property and the study on the performances of thesamples over the light intensity shows, the enhancement in the rate of decreases in resistance, which ishigher than the undoped sample ware discussed.